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Call for Paper - May 2015 Edition
IJCA solicits original research papers for the May 2015 Edition. Last date of manuscript submission is April 20, 2015. Read More

Microscopic Comprehension of P1 Type of Pre Production Defects in Software Development Process

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IJCA Proceedings on International Conference on Communication, Computing and Information Technology
© 2015 by IJCA Journal
ICCCMIT 2014 - Number 1
Year of Publication: 2015
Authors:
Bhagavant Deshpande
Suma. V

Bhagavant Deshpande and Suma. V. Article: Microscopic Comprehension of P1 Type of Pre Production Defects in Software Development Process. IJCA Proceedings on International Conference on Communication, Computing and Information Technology ICCCMIT 2014(1):20-24, March 2015. Full text available. BibTeX

@article{key:article,
	author = {Bhagavant Deshpande and Suma. V},
	title = {Article: Microscopic Comprehension of P1 Type of Pre Production Defects in Software Development Process},
	journal = {IJCA Proceedings on International Conference on Communication, Computing and Information Technology},
	year = {2015},
	volume = {ICCCMIT 2014},
	number = {1},
	pages = {20-24},
	month = {March},
	note = {Full text available}
}

Abstract

Existence of defects during software development process is basically attributable to the intrinsic complex nature of software. Hence, various defect management techniques are adopted in software industries in order to enhance the level of confidence during software development process such that the end product is deployed with as minimal defects as possible. Nevertheless, there still reside defects which escape the production system and gets deployed onsite as defect leaks. However, it is not just the defect leak which is matter of concern, but the type of defect that had escaped from quality assurance team. This paper thus aims to provide a comprehensive examination of defect leak and its root cause analysis. The study is carried out in one of the leading product based software industry where projects for investigation comprise of non-critical applications. The inferences throw light on the possible root causes for occurrence of P1 type of pre-production defects.

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